Services > Advanced Field Testing > Hotspot & Electrical Risk Investigation
Hotspot & Electrical Risk Investigation
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Electroluminescence (EL) Testing
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Infrared Thermography
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IV Curve Tracing
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Visual Inspection
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Hidden electrical defect testing
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BOS / Electrical Field Testing
Investigate hotspots and hidden electrical defects before they become bigger failures
Hotspots can point to more than one problem. Some are caused by shading, soiling, module defects, failed substrings, bypass diode issues, connector problems, or other electrical faults. Some issues are visible during routine inspection. Others only appear under specific operating or shading conditions.
A hotspot or electrical risk investigation helps you understand what is causing abnormal heating or electrical behavior, where the affected modules or strings are located, and what action should be taken next.
Intertek CEA uses targeted field testing to help owners and operators move from “we see hotspots” or “we suspect an electrical issue” to a clearer view of the underlying problem.
When this inspection helps
Use this page for situations like:
Thermal scans show hotspots or recurring thermal anomalies.
A PV system has unexplained hotspot behavior.
Lost bypass diodes are suspected.
Lost substrings or failed substrings are suspected.
Standard inspection has not explained the issue.
Modules look normal, but electrical risk is still suspected.
A thermal event occurred and the affected area needs follow-up investigation.
You need to identify which strings or modules should be prioritized for further review or replacement.
What we may test
The right inspection method depends on the hotspot pattern, the suspected electrical defect, and whether the issue appears under normal operation or only under specific test conditions. Intertek CEA may combine thermography, visual inspection, EL testing, Lost Bypass Diode testing, Lost Substring testing, string-level testing, and additional electrical measurements.
| Method / service | What it helps identify | When it is useful |
|---|---|---|
| Thermography / targeted IR | Hotspots, thermal irregularities, affected modules or strings, and thermal behavior under specific field conditions. | Useful for identifying where abnormal heating is occurring and for supporting follow-up investigation. |
| Visual inspection | Visible damage, burn marks, broken glass, connector issues, wiring concerns, and site-level evidence. | Useful when hotspot findings or thermal events need to be checked against visible site conditions. |
| EL testing | Cell-level defects, inactive areas, damaged cells, and lost substring-related issues that may not be visible from the outside. | Useful when hotspot or electrical behavior may be linked to hidden module damage or substring issues. |
| Lost Bypass Diode testing | Lost or defective bypass diode behavior that may not appear during standard thermal scans. | Useful when hidden diode defects are suspected or when shading-related hotspot risk needs to be assessed. |
| Lost Substring testing | Defective or missing substring connections that can cause power loss and abnormal module behavior. | Useful when failed or disconnected substrings are suspected. |
| String-level testing | Whether affected strings are present and which strings should be prioritized for closer investigation. | Useful as a screening step before narrowing the issue to module level. |
| Additional electrical measurements | Electrical behavior that helps narrow the issue from string level to module level. | Useful when initial screening shows affected strings and module-level identification is needed. |
The exact scope depends on the suspected defect, operating conditions, shading conditions, system layout, and whether the results need to support replacement planning, warranty discussions, insurance documentation, or root-cause analysis.
How we decide the right scope
The final inspection plan depends on the hotspot pattern, the suspected electrical defect, and the level of evidence needed.
What has already been observed?
If previous thermography shows hotspots, the inspection can focus on confirming the affected areas and identifying whether the issue is isolated or repeated. If the concern is only suspected, the first step may be broader screening.
Is the issue visible under normal operating conditions?
Some defects appear during standard thermography. Others, such as lost bypass diode issues, may only show under specific shading or energized test conditions. The test setup needs to match the suspected fault.
Is the concern at module, substring, string, or system level?
Hotspot and electrical risk investigations often need to narrow the problem step by step. The investigation may start at string level and then move toward module-level identification where needed.
What defect type is suspected?
Lost bypass diodes, lost substrings, damaged cells, connector issues, wiring concerns, and visible thermal damage require different evidence. The method should follow the suspected defect, not the other way around.
What decision needs to be made?
The scope should support the next decision: continued operation, targeted replacement, wider inspection, repair planning, warranty discussion, insurance documentation, or deeper root-cause analysis.
What you get
The report should give your team a clear view of:
Where hotspots or electrical anomalies were identified
Which strings, modules, or site areas appear affected
Whether the issue appears isolated or repeated
Whether lost bypass diode or lost substring behavior is suspected or confirmed
Which modules or strings should be prioritized for follow-up or replacement
Whether additional testing or root-cause analysis is recommended
What evidence can support repair, warranty, insurance, or operational decisions
Request a commissioning field testing plan
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